Patent Search Results

1 8,445,382 Side wall pore sealing for low-k dielectrics
2 8,445,377 Mechanically robust metal/low-k interconnects
3 8,440,564 Schemes for forming barrier layers for copper in interconnect structures
4 8,440,508 Hydrogen barrier for ferroelectric capacitors
5 8,426,307 Reducing resistivity in interconnect structures of integrated circuits
6 8,420,535 Copper interconnection, method for forming copper interconnection structure, and semiconductor device
7 8,420,531 Enhanced diffusion barrier for interconnect structures
8 8,420,528 Manufacturing method of a semiconductor device having wirings
9 8,415,249 Method of manufacturing semiconductor device
10 8,404,580 Methods for fabricating semiconductor devices
11 8,395,264 Substrate comprising alloy film of metal element having barrier function and metal element having catalytic power
12 8,383,509 Manufacture method for semiconductor device having improved copper diffusion preventive function of plugs and wirings made of copper or copper alloy and semiconductor device of this kind
13 8,383,508 Method for fabricating opening
14 8,383,507 Method for fabricating air gap interconnect structures
15 8,373,273 Methods of forming integrated circuit devices having damascene interconnects therein with metal diffusion barrier layers and devices formed thereby
16 8,368,218 Adhesive flexible barrier film, method of forming same, and organic electronic device including same
17 8,367,542 Semiconductor device manufacturing method and semiconductor device manufacturing apparatus
18 8,367,541 Semiconductor device suitable for a ferroelectric memory and manufacturing method of the same
19 8,357,609 Dual damascene-like subtractive metal etch scheme
20 8,349,731 Methods for forming copper diffusion barriers for semiconductor interconnect structures
21 8,349,725 Method of manufacturing semiconductor device, semiconductor manufacturing apparatus, and storage medium
22 8,349,724 Method for improving electromigration lifetime of copper interconnection by extended post anneal
23 8,344,513 Barrier for through-silicon via
24 8,330,275 Interconnect structure for semiconductor devices
25 8,329,569 Deposition of ruthenium or ruthenium dioxide
26 8,319,341 Semiconductor device with gate structure
27 8,314,494 Metal cap layer of increased electrode potential for copper-based metal regions in semiconductor devices
28 8,310,052 Semiconductor device and method for manufacturing same
29 8,309,456 Method and system for metal barrier and seed integration
30 8,304,340 Method for manufacturing stacked contact plugs
31 8,298,934 Structure and method of creating entirely self-aligned metallic contacts
32 8,298,933 Conformal films on semiconductor substrates
33 8,288,276 Method of forming an interconnect structure including a metallic interfacial layer located at a bottom via portion
34 8,288,275 Method forming contact plug for semiconductor device using H2 remote plasma treatment
35 8,288,273 Method for forming a patterned thick metallization atop a power semiconductor chip
36 8,278,207 Methods of manufacturing semiconductor devices
37 8,278,205 Semiconductor device and method for manufacturing the same
38 8,273,654 Producing a vertical transistor including reentrant profile
39 8,269,347 Semiconductor chip, electrode structure therefor and method for forming same
40 8,258,626 Copper interconnection, method for forming copper interconnection structure, and semiconductor device
41 8,258,057 Copper-filled trench contact for transistor performance improvement
42 8,253,182 Nonvolatile semiconductor memory and method for fabricating the same
43 8,252,690 In situ Cu seed layer formation for improving sidewall coverage
44 8,252,680 Methods and architectures for bottomless interconnect vias
45 8,247,321 Method of manufacturing semiconductor device, semiconductor device, electronic instrument, semiconductor manufacturing apparatus, and storage medium
46 8,247,301 Substrate and manufacturing method therefor
47 8,242,015 Film forming method and film forming apparatus
48 8,236,687 Die-bonding method of LED chip and LED manufactured by the same
49 8,236,683 Conductor structure including manganese oxide capping layer
50 8,236,681 Manufacturing method of semiconductor integrated circuit device